Characterization of the morphology of primary silicon particles using synchrotron X-ray tomography

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• 作者：J. Wang^a ; Z. Guo^a ; ^b ; S.M. Xiong^a ; ^b ; ^{smxiong@tsinghua.edu.cn}
• 关键词：X-ray tomography ; Hypereutectic Al-Si alloy ; Twinned primary silicon morphology
• 刊名：Materials Characterization
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：123
• 期：Complete
• 页码：354-359
• 全文大小：1512 K
• 卷排序：123

文摘

The 3D morphology of primary silicon particle was reconstructed completely. The morphology size and growth ratio can be determined with quantitative data. Both octahedral and twinned shapes grow with certain ratios among certain directions. Growth ratios can assess crystal growth during solidification.