Investigated an ultra steep, symmetric and dynamically configurable, E-SiNW-SB-FET.
Steep SS is due to the cumulative effect of weak impact-ionization induced positive feedback and electrostatic modulation of Schottky barrier heights at both terminals.
The polarity of the devices can be changed on-the-fly.
A calibrated 3-D TCAD simulation re sults exhibit the SS of 2 mV/dec for n-E-SiNW-SB-FET and 9 mV/dec for p-E-SiNW-SB-FET for about five decades of current.