Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias
SEM and KPFM assess the effect of voltage on surface potential of IBC solar cells. KPFM enables to measure electrical bias changes value on IBC solar cells. Measurements under reverse bias can enable to reveal electrical defects. Measurements under forward biases can enable to locate zones of series resistance. Nano-identation is an effective technique for accurate repositioning at the nano-scale.