Time-resolved kelvin probe force microscopy to study population and depopulation of traps in electron or hole majority organic semiconductors

详细信息    查看全文

• 作者：Jason P. Moscatello^a ; Chloe V. Castaneda^a ; Alyina Zaidi^a ; Minxuan Cao^a ; Ozlem Usluer^b ; Alejandro L. Briseno^b ; Katherine E. Aidala^a ; ^{kaidala@mtholyoke.edu}
• 关键词：Scanning probe microscopy ; Organic semiconductors ; Organic photovoltaics ; Charge motion ; P3HT ; PDI-CN2
• 刊名：Organic Electronics
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：41
• 期：Complete
• 页码：26-32
• 全文大小：1098 K
• 卷排序：41

文摘

Time-resolved KPFM records population and depopulation of traps in OFETs. Real-time screening measured with KPFM in P3HT and PDI-CN2 OFETs. Development and depopulation of traps due to bias stress observed in P3HT with KPFM.