StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
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- 作者：A. De Backera ; 1 ; K.H.W. van den Bosa ; 1 ; W. Van den Broekb ; J. Sijbersc ; S. Van Aerta ; sandra.vanaert@uantwerpen.be" class="auth_mail" title="E-mail the corresponding author
- 关键词：High-resolution (scanning) transmission electron microscopy (HR (S)TEM) ; Dataprocessing/image processing ; Quantitative electron microscopy ; General methods in microscopy ; Statistical parameter estimation theory ; Tools ; Model-based fitting
- 刊名：Ultramicroscopy
- 出版年：2016
- 出版时间：December 2016
- 年：2016
- 卷：171
- 期：Complete
- 页码：104-116
- 全文大小：2183 K
文摘
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An efficient model-based method for quantitative electron microscopy is introduced.
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Images are modelled as a superposition of 2D Gaussian peaks.
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Overlap between neighbouring columns is taken into account.
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Structure parameters can be obtained with the highest precision and accuracy.
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StatSTEM, auser friendly program (GNU public license) is developed.