Migration behavior of network-modifier cations at glass surface during electrical poling
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- 作者：Toshio Suzukia ; toshio-suzuki@agc.com" class="auth_mail" title="E-mail the corresponding author ; Junko Anzaia ; Yasuyuki Takimotoa ; Keiichiro Urajib ; Kiyoshi Yamamotoa ; Junji Nishiic
- 关键词：Electrical poling ; Cation migration ; Si E&prime ; center ; C60-XPS ; ESR
- 刊名：Journal of Non-Crystalline Solids
- 出版年：2016
- 出版时间：15 November 2016
- 年：2016
- 卷：452
- 期：Complete
- 页码：125-129
- 全文大小：629 K
文摘
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Electrically poled soda-lime silicate glass was analyzed using C60-XPS and ESR.
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Deficient layers of Na, Mg, Ca are formed at the anode side surface.
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Mg and Ca are concentrated in the layer of 200–700 nm depth from the surface.
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Oxygen content decreased by degassing as oxygen molecules from the glass surface.
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Hole center and Si E′ center are generated in electrically poled glass.