MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions

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• 作者：Hideaki Yamada ; Kazuya Ichiki ; Yoshihiko Nakata ; Satoshi Ninomiya ; Toshio Seki ; Takaaki Aoki ; Jiro Matsuo
• 关键词：Imaging mass spectrometry ; SIMS ; Heavy swift ions ; Ion sputtering ; Gas cluster ions ; Animal cells
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2010
• 出版时间：June 2010
• 年：2010
• 卷：268
• 期：11-12
• 页码：1736-1740
• 全文大小：452 K

文摘

Molecular imaging of animal cells was successfully obtained by using the technique of MeV-energy probe secondary ion mass spectrometry (MeV-SIMS) and sample etching with Ar cluster ion beam. In order to indicate benefits of using Ar cluster beam for etching biomaterials, cholesterol and phospholipids were etched with Ar cluster ions and SIMS measurements for the before and after etching samples were performed. Moreover, secondary ion images of the animal cells etched with Ar cluster ions were acquired by using MeV-energy ion beam as a probe.