Fano Resonances and Leakage Radiation for High-Resolution Plasmonic Sensing

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• 作者：Benedikt Stein ; Jean-Yves Laluet ; Elo茂se Devaux ; Cyriaque Genet ; Thomas W. Ebbesen
• 刊名：The Journal of Physical Chemistry C
• 出版年：2012
• 出版时间：March 15, 2012
• 年：2012
• 卷：116
• 期：10
• 页码：6092-6096
• 全文大小：304K
• 年卷期：v.116,no.10(March 15, 2012)
• ISSN：1932-7455

文摘

We demonstrate that the asymmetric profiles of Fano resonances lead to important figure of merit (FOM) improvements of surface plasmon (SP)-based refractive index sensors. Exploiting the high angular resolution of a leakage radiation microscope, our sensor shows a 75% improvement over the optimal FOM of classic SP-based sensors, reaching a FOM as high as 234 卤 1 RIU^鈥?. We also perform a full noise assessment of the system and achieve a final resolution of O(10^鈥?) RIU.