New Insights into the Electronic Transport of Reduced Graphene Oxide Using Scanning Electrochemical Microscopy
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- 作者：Tiphaine Bourgeteau ; Steven Le Vot ; Michael Bertucchi ; Vincent Derycke ; Bruno Jousselme ; St茅phane Campidelli ; Renaud Cornut
- 刊名：The Journal of Physical Chemistry Letters
- 出版年：2014
- 出版时间：December 4, 2014
- 年：2014
- 卷：5
- 期：23
- 页码：4162-4166
- 全文大小：302K
- ISSN：1948-7185
文摘
The present work investigates the electronic conduction of reduced graphene oxide flakes and the coupling between flakes through a combined SECM (scanning electrochemical microscopy), AFM, and SEM analysis. Images of individual and interconnected flakes directly reveal the signature of the contact resistance between flakes in a noncontact and substrate-independent way. Quantitative evaluation of the parameters is achieved with the support of numerical simulations to interpret the experimental results. The interflakes contact resistance importantly impacts the transport of electrons, which can be anticipated as a key parameter in r-GO-based materials used in fuel cells, lithium batteries, supercapacitors, and organic electronic devices.