Surface Crystallization of Cordierite from Glass Studied by High-Temperature X-ray Diffraction and Electron Backscatter Diffraction (EBSD)

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• 作者：Wolfgang Wisniewski ; Carlos Andr茅 Baptista ; Matthias M眉ller ; G眉nter V枚lksch ; Christian R眉ssel
• 刊名：Crystal Growth & Design
• 出版年：2011
• 出版时间：October 5, 2011
• 年：2011
• 卷：11
• 期：10
• 页码：4660-4666
• 全文大小：991K
• 年卷期：v.11,no.10(October 5, 2011)
• ISSN：1528-7505

文摘

A glass with the composition of stoichiometric cordierite (2Al₂O₃路2MgO路5SiO₂) shows surface crystallization during thermal annealing. High temperature X-ray diffraction (HT-XRD) was performed on a compact sample. The surface crystallization is further studied using scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD). The formation of an oriented layer at the immediate surface is not observed. This is in disagreement with previous reports in the literature. Topographical effects during crystallization and EBSD pattern acquisition are analyzed by atomic force microscopy.