Conductance of Single Cobalt Chalcogenide Cluster Junctions

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• 作者：Brycelyn M. Boardman ; Jonathan R. Widawsky ; Young S. Park ; Christine L. Schenck ; Latha Venkataraman ; Michael L. Steigerwald ; Colin Nuckolls
• 刊名：Journal of the American Chemical Society
• 出版年：2011
• 出版时间：June 8, 2011
• 年：2011
• 卷：133
• 期：22
• 页码：8455-8457
• 全文大小：728K
• 年卷期：v.133,no.22(June 8, 2011)
• ISSN：1520-5126

文摘

Understanding the electrical properties of semiconducting quantum dot devices have been limited due to the variability of their size/composition and the chemistry of ligand/electrode binding. Furthermore, to probe their electrical conduction properties and its dependence on ligand/electrode binding, measurements must be carried out at the single dot/cluster level. Herein we report scanning tunneling microscope based break junction measurements of cobalt chalcogenide clusters with Te, Se and S to probe the conductance properties. Our measured conductance trends show that the Co鈥揟e based clusters have the highest conductance while the Co-S clusters the lowest. These trends are in very good agreement with cyclic voltammetry measurements of the first oxidation potentials and with density functional theory calculations of their HOMO鈥揕UMO gaps.