We study the range of orientational order of a single layer of cylindrical block copoly
mer
microdo
mains annealed on several types of substrates. The orientational persistence length or ne
maticcorrelation length (
![](/i<font color=)
mages/gifchars/xi.gif" BORDER=0 >) is evaluated using recently developed i
maging and analysis
methods to
measurethe grain size of the block copoly
mer
microdo
mains. We show that the substrate can lower
![](/i<font color=)
mages/gifchars/xi.gif" BORDER=0 > for blockcopoly
mers with a
majority co
mponent that interacts strongly with the substrate, but this can be
mitigatedby attaching a buffer layer of polystyrene brushes to the substrate. In addition, we show that, for a blockcopoly
mer where the block that strongly interacts with the substrate is the
minority co
mponent, the
microdo
main correlation length does not increase when substrates are treated with this buffer layer. Wesuggest that in this case the brushes do not increase
![](/i<font color=)
mages/gifchars/xi.gif" BORDER=0 > not only because of the lower volu
me fraction ofthe strongly interacting co
mponent but also because there are block copoly
mer wetting layers at the
freeand substrate interfaces that decouple the
microdo
mains fro
m the substrate in a si
milar
manner as thepolystyrene brushes.