Tip-Modulation Scanned Gate Microscopy

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• 作者：Neil R. Wilson ; David H. Cobden
• 刊名：Nano Letters
• 出版年：2008
• 出版时间：August 2008
• 年：2008
• 卷：8
• 期：8
• 页码：2161-2165
• 全文大小：230K
• 年卷期：v.8,no.8(August 2008)
• ISSN：1530-6992

文摘

We introduce a technique that improves the sensitivity and resolution and eliminates the nonlocal background of scanned gate microscopy (SGM). In conventional SGM, a voltage bias is applied to the atomic force microscope tip and the sample conductance is measured as the tip is scanned. In the new technique, which we call tip-modulation SGM (tmSGM), the biased tip is oscillated and the induced oscillation of the sample conductance is measured. Applied to single-walled carbon nanotube network devices, tmSGM gives sharp, low-noise and background-free images.