Crystallographic Characterization of II鈥揤I Semiconducting Nanostructures via Optical Second Harmonic Generation

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• 作者：Ming-Liang Ren ; Rahul Agarwal ; Wenjing Liu ; Ritesh Agarwal
• 刊名：Nano Letters
• 出版年：2015
• 出版时间：November 11, 2015
• 年：2015
• 卷：15
• 期：11
• 页码：7341-7346
• 全文大小：405K
• ISSN：1530-6992

文摘

We demonstrate the utility of optical second harmonic generation (SHG) polarimetry to perform structural characterization of noncentrosymmetric, single-crystalline II鈥揤I semiconducting nanowires, nanobelts, and nanoflakes. By analyzing anisotropic SHG polarimetric patterns, we distinguish between wurtzite and zincblende II鈥揤I semiconducting crystal structures and determine their growth orientation. The crystallography of these nanostructures was then confirmed via transmission electron microscopy measurements performed on the same system. In addition, we show that some intrinsic material properties such as nonlinear coefficients and geometry-dependent optical in-coupling coefficients can also be determined from the SHG experiments in WZ nanobelts. The ability to perform SHG-based structural characterization and crystallographic study of II鈥揤I semiconducting single-crystalline nanomaterials will be useful to correlate structure鈥損roperty relationships of nanodevices on which transmission electron microscopy measurements cannot be typically performed.