Connecting Dopant Bond Type with Electronic Structure in N-Doped Graphene
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文摘
Robust methods to tune the unique electronic properties of graphene by chemical modification are in great demand due to the potential of the two dimensional material to impact a range of device applications. Here we show that carbon and nitrogen core-level resonant X-ray spectroscopy is a sensitive probe of chemical bonding and electronic structure of chemical dopants introduced in single-sheet graphene films. In conjunction with density functional theory based calculations, we are able to obtain a detailed picture of bond types and electronic structure in graphene doped with nitrogen at the sub-percent level. We show that different N-bond types, including graphitic, pyridinic, and nitrilic, can exist in a single, dilutely N-doped graphene sheet. We show that these various bond types have profoundly different effects on the carrier concentration, indicating that control over the dopant bond type is a crucial requirement in advancing graphene electronics.

Keywords:

s" href="http://pubs.acs.org/action/doSearch?action=search&searchText=Nitrogen%5C-doped+graphene&qsSearchArea=searchText">Nitrogen-doped graphene; s" href="http://pubs.acs.org/action/doSearch?action=search&searchText=workfunction&qsSearchArea=searchText">workfunction; s" href="http://pubs.acs.org/action/doSearch?action=search&searchText=bonding&qsSearchArea=searchText">bonding; s" href="http://pubs.acs.org/action/doSearch?action=search&searchText=electronic+structure&qsSearchArea=searchText">electronic structure; s" href="http://pubs.acs.org/action/doSearch?action=search&searchText=X%5C-ray+spectroscopy&qsSearchArea=searchText">X-ray spectroscopy

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