Electrical Measurements in Molecular Electronics

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• 作者：Dustin K. James and James M. Tour
• 刊名：Chemistry of Materials
• 出版年：2004
• 出版时间：November 16, 2004
• 年：2004
• 卷：16
• 期：23
• 页码：4423 - 4435
• 全文大小：300K
• 年卷期：v.16,no.23(November 16, 2004)
• ISSN：1520-5002

文摘

This paper reviews the various methods used to measure the electrical characteristics ofindividual or small groups of molecules, including crossed-wire junctions, mechanicallycontrollable break junctions, conducting atomic force microscopy, scanning tunnelingmicroscopy, molecular electronics on silicon surfaces, the NanoCell, nanopores, and otherdevices. It is shown that in the most common embodiment, the metal-molecule-metaljunction, the assembly must be considered in whole. The characteristics of the moleculecannot be easily separated from the metal electrodes connected to it or from the methodused to do the testing. I(V,T) data is necessary to rule out non-molecular transportmechanisms such as metal filament formation.