Use of Optical Contrast To Estimate the Degree of Reduction of Graphene Oxide

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• 作者：Francesco Perrozzi ; Stefano Prezioso ; Maurizio Donarelli ; Federico Bisti ; Patrizia De Marco ; Sandro Santucci ; Michele Nardone ; Emanuele Treossi ; Vincenzo Palermo ; Luca Ottaviano
• 刊名：The Journal of Physical Chemistry C
• 出版年：2013
• 出版时间：January 10, 2013
• 年：2013
• 卷：117
• 期：1
• 页码：620-625
• 全文大小：338K
• 年卷期：v.117,no.1(January 10, 2013)
• ISSN：1932-7455

文摘

We report an optical contrast study of graphene oxide on 72 nm Al₂O₃/Si(100) and 300 nm SiO₂/Si(100) as a function of its reduction degree. The reduction has been performed by means of ultrahigh vacuum thermal annealing from 25 掳C (pristine graphene oxide) to 670 掳C. In parallel to the optical contrast investigation, performed with optical microscopy, the graphene oxide films have been characterized with core level X-ray photoemission spectroscopy and micro-Raman spectroscopy. The optical contrast of graphene oxide (normalized to the one measured for pure graphene) on both substrates ranges from 0.4 to 1.0 for pristine and 670 掳C annealed graphene oxide, respectively. Optical microscopy and X-ray photoemission spectroscopy data have been cross-correlated, leading to calibration graphs that demonstrate that just by simply measuring the optical contrast of graphene oxide one can determine with very good approximation the fraction of sp² hybridized carbon.