Microstructure Origin of the Conductivity Differences in Aggregated CuS Films of Different Thickness

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• 作者：Svetlana Erokhina ; Victor Erokhin ; Claudio Nicolini ; Francesca Sbrana ; Davide Ricci ; and Ermanno di Zitti
• 刊名：Langmuir
• 出版年：2003
• 出版时间：February 4, 2003
• 年：2003
• 卷：19
• 期：3
• 页码：766 - 771
• 全文大小：252K
• 年卷期：v.19,no.3(February 4, 2003)
• ISSN：1520-5827

文摘

The structure of thin, aggregated layers of CuS nanoparticles, grown in Langmuir-Blodgett filmprecursors, was investigated with atomic force microscopy along with the study of their electrical conductivity.Very thin layers revealed an essentially insulating behavior. These layers were composed of isolatedparticle aggregates that had a mean thickness corresponding to the average particle diameter. The increaseof the film thickness resulted in the formation of conducting pathways formed by the aggregates in thelayer plane. Such samples revealed an increased conductivity. Finally, when the thickness of the initialprecursor LB layers was more than 25 bilayers, the resulting aggregated films were uniform and theirelectrical conductivity was high.