Disposable Attenuated Total Reflection-Infrared Crystals from Silicon Wafer: A Versatile Approach to Surface Infrared Spectroscopy

详细信息    查看全文

• 作者：Engin Karabudak ; Recep Kas ; Wojciech Ogieglo ; Damon Rafieian ; Stefan Schlautmann ; R. G. H. Lammertink ; Han J. G. E. Gardeniers ; Guido Mul
• 刊名：Analytical Chemistry
• 出版年：2013
• 出版时间：January 2, 2013
• 年：2013
• 卷：85
• 期：1
• 页码：33-38
• 全文大小：276K
• 年卷期：v.85,no.1(January 2, 2013)
• ISSN：1520-6882

文摘

Attenuated total reflection-infrared (ATR-IR) spectroscopy is increasingly used to characterize solids and liquids as well as (catalytic) chemical conversion. Here we demonstrate that a piece of silicon wafer cut by a dicing machine or cleaved manually can be used as disposable internal reflection element (IRE) without the need for polishing and laborious edge preparation. Technical aspects, fundamental differences, and pros and cons of these novel disposable IREs and commercial IREs are discussed. The use of a crystal (the Si wafer) in a disposable manner enables simultaneous preparation and analysis of substrates and application of ATR spectroscopy in high temperature processes that may lead to irreversible interaction between the crystal and the substrate. As representative application examples, the disposable IREs were used to study high temperature thermal decomposition and chemical changes of polyvinyl alcohol (PVA) in a titania (TiO₂) matrix and assemblies of 65鈥?50 nm thick polystyrene (PS) films.