The State of Strain in Single GaN Nanocolumns As Derived from Micro-Photoluminescence Measurements
详细信息    查看全文
文摘
In the present paper, studies on the state of strain in single and ensembles of nanocolumns investigated by photoluminescence spectroscopywill be presented. The GaN nanocolumns were either grown in a bottom-up approach or prepared in a top-down approach by etching compactGaN layers grown on Si(111) and sapphire (0001) substrates. Experimental evidence for strain relaxation of the nanocolumns was found. Thedifference and development of the strain value for different nanocolumns could be verified by spatially resolved micro-photoluminescence onsingle nanocolumns separated from their substrate. A common D0X spectral position at 3.473 eV was found for all separated single GaNnanocolumns independent of the substrate or processing technique used, as expected for a relaxed system.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700