Quantifying the Semiconducting Fraction in Single-Walled Carbon Nanotube Samples through Comparative Atomic Force and Photoluminescence Microscopies

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• 作者：Anton V. Naumov ; Oleg A. Kuznetsov ; Avetik R. Harutyunyan ; Alexander A. Green ; Mark C. Hersam ; Daniel E. Resasco ; Pavel N. Nikolaev ; R. Bruce Weisman
• 刊名：Nano Letters
• 出版年：2009
• 出版时间：September 9, 2009
• 年：2009
• 卷：9
• 期：9
• 页码：3203-3208
• 全文大小：156K
• 年卷期：v.9,no.9(September 9, 2009)
• ISSN：1530-6992

文摘

A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.