The stability of Pt nanoparticles (NPs) supported on ultrathin SiO
2 films on Si(111) was inve
stigated
in situ under H
2 and O
2 (0.5 Torr) by high-pressure X-ray photoelectron spectroscopy (HP-XPS) and
ex situ by atomic force microscopy (AFM). No indication of sintering was observed up to 600 掳C in both reducing and oxidizing environments for size-selected Pt NPs synthesized by inverse micelle encapsulation. However, HP-XPS revealed a competing effect of volatile PtO
x desorption from the Pt NPs (2 and 4 nm NP sizes) at temperatures above 450 掳C in the presence of 0.5 Torr of O
2. Under oxidizing conditions, the entire NPs were oxidized, although with no indication of a PtO
2 phase, with XPS binding energies better matching PtO. The stability of catalytic NPs in hydrogenation and oxidation reactions is of great importance due to the strong structure sensitivity observed in a number of catalytic processes of industrial relevance. An optimum must be found between the maximization of the surface active sites and metal loading (
i.e., minimization of the NP size), combined with the maximization of their stability, which, as it will be shown here, is strongly dependent on the reaction environment.
Keywords:
platinum nanoparticle; inverse micelle; volatile PtOx; high-pressure X-ray photoelectron spectroscopy; HP-XPS; atomic force microscopy; AFM