Principal Component Analysis (PCA)-Assisted Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): A Versatile Method for the Investigation of Self-Assembled Monolayers and Multilayers as Precurso

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• 作者：Markus Holzweber ; Thomas Heinrich ; Valentin Kunz ; Sebastian Richter ; Christoph H.-H. Traulsen ; Christoph A. Schalley ; Wolfgang E. S. Unger
• 刊名：Analytical Chemistry
• 出版年：2014
• 出版时间：June 17, 2014
• 年：2014
• 卷：86
• 期：12
• 页码：5740-5748
• 全文大小：678K
• 年卷期：v.86,no.12(June 17, 2014)
• ISSN：1520-6882

文摘

The production of high-quality self-assembled monolayers (SAMs) followed by layer-by-layer (LbL) self-assembly of macrocycles is essential for nanotechnology applications based on functional surface films. To help interpret the large amount of data generated by a standard ToF-SIMS measurement, principal component analysis (PCA) was used. For two examples, the advantages of a combination of ToF-SIMS and PCA for quality control and for the optimization of layer-by-layer self-assembly are shown. The first example investigates how different cleaning methods influence the quality of SAM template formation. The second example focuses on the LbL self-assembly of macrocycles and the corresponding stepwise surface modification.