We have utilized the deh
ydrogenation and h
ydrogenation of c
yclohexene as probe reactions tocompare the chemical reactivit
y of Ni overla
yers that are grown epitaxiall
y on a Pt(111) surface. The reactionpathwa
ys of c
yclohexene were investigated using temperature-programmed desorption, high-resolutionelectron energ
y loss (HREELS), and near edge X-ra
y absorption fine structure (NEXAFS) spectroscop
y.Our results provide conclusive spectroscopic evidence that the adsorption and subsequent reactions ofc
yclohexene are unique on the monola
yer Ni surface as compared to those on the clean Pt(111) surfaceor the thick Ni(111) film. HREELS and NEXAFS studies show that c
yclohexene is weakl
y -bonded onmonola
yer Ni/Pt(111) but di-
-bonded to Pt(111) and Ni(111). In addition, a new h
ydrogenation pathwa
yis detected on the monola
yer Ni surface at temperatures as low as 245 K. B
y exposing the monola
yerNi/Pt(111) surface to D
2 prior to the adsorption of c
yclohexene, the total
yield of the normal and deuteratedc
yclohexanes increases b
y approximatel
y 5-fold. Furthermore, the reaction pathwa
y for the completedecomposition of c
yclohexene to atomic carbon and h
ydrogen, which has a selectivit
y of 69% on the thickNi(111) film, is nearl
y negligible (<2%) on the monola
yer Ni surface. Overall, the unique chemistr
y of themonola
yer Ni/Pt(111) surface can be explained b
y the weaker interaction between adsorbates and themonola
yer Ni film. These results also point out the possibilit
y of manipulating the chemical properties ofmetals b
y controlling the overla
yer thickness.