Chemical Measurement and Fluctuation Scaling
详细信息    查看全文
  • 作者:Quentin S. Hanley
  • 刊名:Analytical Chemistry
  • 出版年:2016
  • 出版时间:December 20, 2016
  • 年:2016
  • 卷:88
  • 期:24
  • 页码:12036-12042
  • 全文大小:434K
  • ISSN:1520-6882
文摘
Fluctuation scaling reports on all processes producing a data set. Some fluctuation scaling relationships, such as the Horwitz curve, follow exponential dispersion models which have useful properties. The mean-variance method applied to Poisson distributed data is a special case of these properties allowing the gain of a system to be measured. Here, a general method is described for investigating gain (G), dispersion (β), and process (α) in any system whose fluctuation scaling follows a simple exponential dispersion model, a segmented exponential dispersion model, or complex scaling following such a model locally. When gain and dispersion cannot be obtained directly, relative parameters, GR and βR, may be used. The method was demonstrated on data sets conforming to simple, segmented, and complex scaling. These included mass, fluorescence intensity, and absorbance measurements and specifications for classes of calibration weights. Changes in gain, dispersion, and process were observed in the scaling of these data sets in response to instrument parameters, photon fluxes, mathematical processing, and calibration weight class. The process parameter which limits the type of statistical process that can be invoked to explain a data set typically exhibited 0 < α < 1, with α > 4 possible. With two exceptions, calibration weight class definitions only affected β. Adjusting photomultiplier voltage while measuring fluorescence intensity changed all three parameters (0 < α < 0.8; 0 < βR < 3; 0 < GR < 4.1). The method provides a framework for calibrating and interpreting uncertainty in chemical measurement allowing robust comparison of specific instruments, conditions, and methods.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700