Planar Edge Schottky Barrier-Tunneling Transistors Using Epitaxial Graphene/SiC Junctions
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- 作者：Jan Kunc ; Yike Hu ; James Palmer ; Zelei Guo ; John Hankinson ; Salah H. Gamal ; Claire Berger ; Walt A. de Heer
- 刊名：Nano Letters
- 出版年：2014
- 出版时间：September 10, 2014
- 年：2014
- 卷：14
- 期：9
- 页码：5170-5175
- 全文大小：364K
- ISSN：1530-6992
文摘
A purely planar graphene/SiC field effect transistor is presented here. The horizontal current flow over one-dimensional tunneling barrier between planar graphene contact and coplanar two-dimensional SiC channel exhibits superior on/off ratio compared to conventional transistors employing vertical electron transport. Multilayer epitaxial graphene (MEG) grown on SiC(0001虆) was adopted as the transistor source and drain. The channel is formed by the accumulation layer at the interface of semi-insulating SiC and a surface silicate that forms after high vacuum high temperature annealing. Electronic bands between the graphene edge and SiC accumulation layer form a thin Schottky barrier, which is dominated by tunneling at low temperatures. A thermionic emission prevails over tunneling at high temperatures. We show that neglecting tunneling effectively causes the temperature dependence of the Schottky barrier height. The channel can support current densities up to 35 A/m.