Fluorene Oxidation by Coupling of Ozone, Radiation, and Semiconductors: A Mathematical Approach to the Kinetics
详细信息    查看全文
文摘
The kinetics of fluorene oxidation by systems that include ozone (O3), ozonation in the presence of titaniumdioxide (O3/TiO2), photolytic ozonation (O3/UV-A), titanium dioxide photocatalysis (TiO2/UV-A), and titaniumdioxide photocatalytic ozonation (UV-A/O3/TiO2) has been mathematically assessed by the proposal of amechanism based on experimental results. The conventional free-radical mechanism involved in ozone processeswas the starting point to model the different systems. Single fluorene ozonation simulation suggests the existenceof a hydroxyl radical source other than ozone activation through hydroxyl anions and/or the ionic form ofhydrogen peroxide. Combination of O3 with TiO2 or UV-A radiation involves a negligible effect in the firstcase and the improvement of the fluorene removal rate in the second case. In the latter process, ozone photolysislikely entails a higher formation of hydroxyl radicals. Because fluorene does not absorb UV-A light,photocatalytic oxidation of fluorene by the system TiO2/UV-A also indicates the development of surfaceradical reactions. Finally, the photocatalytic ozonation of the polycyclic aromatic hydrocarbon implies asynergistic effect of the single systems.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700