Solvent vapor annealing of block copolymer thin films can produce a range of morphologies different from the equilibrium bulk morphology. By systematically varying the flow rate of two different solvent vapors (toluene and
n-heptane) and an inert gas, phase maps showing the morphology
versus vapor pressure of the solvents were constructed for 45 kg/mol polystyrene-
block-polydimethylsiloxane diblock copolymer films of different thicknesses. The final morphology was correlated with the swelling of the block copolymer and homopolymer films and the solvent vapor annealing conditions. Self-consistent field theory is used to model the effects of solvent swelling. These results provide a framework for predicting the range of morphologies available under different solvent vapor conditions, which is important in lithographic applications where precise control of morphology and critical dimensions are essential.
Keywords:
self-assembly; solvent vapor annealing; ps-pdms; block copolymer; toluene; heptane; self-consistent field theory