Visualizing Point Defects in Transition-Metal Dichalcogenides Using Optical Microscopy

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• 作者：Hye Yun Jeong ; Si Young Lee ; Thuc Hue Ly ; Gang Hee Han ; Hyun Kim ; Honggi Nam ; Zhao Jiong ; Bong Gyu Shin ; Seok Joon Yun ; Jaesu Kim ; Un Jeong Kim ; Sungwoo Hwang ; Young Hee Lee
• 刊名：ACS Nano
• 出版年：2016
• 出版时间：January 26, 2016
• 年：2016
• 卷：10
• 期：1
• 页码：770-777
• 全文大小：647K
• ISSN：1936-086X

文摘

While transmission electron microscopy and scanning tunneling microscopy reveal atomic structures of point defect and grain boundary in monolayer transition-metal dichalcogenides (TMDs), information on point defect distribution in macroscale is still not available. Herein, we visualize the point defect distribution of monolayer TMDs using dark-field optical microscopy. This was realized by anchoring silver nanoparticles on defect sites of MoS<sub>2sub> under light illumination. The optical images clearly revealed that the point defect distribution varies with light power and exposure time. The number of silver nanoparticles increased initially and reached a plateau in response to light power or exposure time. The size of silver nanoparticles was a few hundred nanometers in the plateau region as observed using optical microscopy. The measured defect density in macroscale was ～2 × 10<sup>10sup> cm<sup>–2sup>, slightly lower than the observed value (4 × 10<sup>11sup> cm<sup>–2sup>) from scanning tunneling microscopy.