Unity-Order Index Change in Transparent Conducting Oxides at Visible Frequencies

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• 作者：Eyal Feigenbaum ; Kenneth Diest ; Harry A. Atwater
• 刊名：Nano Letters
• 出版年：2010
• 出版时间：June 9, 2010
• 年：2010
• 卷：10
• 期：6
• 页码：2111-2116
• 全文大小：382K
• 年卷期：v.10,no.6(June 9, 2010)
• ISSN：1530-6992

文摘

We report a method for obtaining unity-order refractive index changes in the accumulation layer of a metal-oxide-semiconductor heterostructure with conducting oxide as the active material. Under applied field, carrier concentrations at the dielectric/conducting oxide interface increase from 1 × 10²¹/cm³ to 2.8 × 10²²/cm³, resulting in a local refractive index change of 1.39 at 800 nm. When this structure is modeled as a plasmonic waveguide, the change corresponds to a modal index change of 0.08 for the plasmonic mode.