Contact-Free Scanning and Imaging with the Scanning Ion Conductance Microscope

详细信息    查看全文

• 作者：Samantha Del Linz ; Eero Willman ; Matthew Caldwell ; David Klenerman ; Anibal Fern谩ndez ; Guy Moss
• 刊名：Analytical Chemistry
• 出版年：2014
• 出版时间：March 4, 2014
• 年：2014
• 卷：86
• 期：5
• 页码：2353-2360
• 全文大小：453K
• 年卷期：v.86,no.5(March 4, 2014)
• ISSN：1520-6882

文摘

Scanning ion conductance microscopy (SICM) offers the ability to obtain very high-resolution topographical images of living cells. One of the great advantages of SICM lies in its ability to perform contact-free scanning. However, it is not yet clear when the requirements for this scan mode are met. We have used finite element modeling (FEM) to examine the conditions for contact-free scanning. Our findings provide a framework for understanding the contact-free mode of SICM and also extend previous findings with regard to SICM resolution. Finally, we demonstrate the importance of our findings for accurate biological imaging.