Polarized Raman Scattering from a Single, Segmented SnO2 Wire

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• 作者：Tsachi Livneh ; Yigal Lilach ; Inna Popov ; Andrei Kolmakov ; Martin Moskovits
• 刊名：Journal of Physical Chemistry C
• 出版年：2011
• 出版时间：September 8, 2011
• 年：2011
• 卷：115
• 期：35
• 页码：17270-17277
• 全文大小：1051K
• 年卷期：v.115,no.35(September 8, 2011)
• ISSN：1932-7455

文摘

The use of polarized Raman as a means for determining the growth direction in nanowires with rutile structure is described. One finds that polarization angle dependence of various phonon bands can vary greatly even for isomorphic structures such as SnO₂, TiO₂, and RuO₂. As a result, different phonon modes act as the most structure-indicative modes for these three systems, as determined from the polarization angle dependence of their intensities. Polarized Raman measurements were carried out on a single tetragonal (rutile) SnO₂ segmented nanowire with the microscale segments with a prismatic structure growing along [110]. We demonstrate how the calculated effect of the refraction inside the wire, which comes into play when the wire's effective diameter is significantly larger than the wavelength of the exciting light, is essential in explaining the experimental results.