Enhanced Raman Scattering with Dielectrics

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• 作者：Ivano Alessandri ; John R. Lombardi
• 刊名：Chemical Reviews
• 出版年：2016
• 出版时间：December 28, 2016
• 年：2016
• 卷：116
• 期：24
• 页码：14921-14981
• 全文大小：2813K
• ISSN：1520-6890

文摘

Dielectrics represent a new frontier for surface-enhanced Raman scattering. They can serve as either a complement or an alternative to conventional, metal-based SERS, offering key advantages in terms of low invasiveness, reproducibility, versatility, and recyclability. In comparison to metals, dielectric systems and, in particular, semiconductors are characterized by a much greater variety of parameters and properties that can be tailored to achieve enhanced Raman scattering or related effects. Light-trapping and subwavelength-focusing capabilities, morphology-dependent resonances, control of band gap and stoichiometry, size-dependent plasmons and excitons, and charge transfer from semiconductors to molecules and vice versa are a few examples of the manifold opportunities associated with the use of semiconductors as SERS-active materials. This review provides a broad analysis of SERS with dielectrics, encompassing different optical phenomena at the basis of the Raman scattering enhancement and introducing future challenges for light harvesting, vibrational spectroscopy, imaging, and sensing.