Temperature-Dependent, Nitrogen-Perturbed Line Shape Measurements in the 谓1 + 谓3 Band of Acetylene Using a Diode Laser Referenced to a Frequency Comb

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• 作者：Matthew J. Cich ; Damien Forthomme ; Christopher P. McRaven ; Gary V. Lopez ; Gregory E. Hall ; Trevor J. Sears ; Arlan. W. Mantz
• 刊名：Journal of Physical Chemistry A
• 出版年：2013
• 出版时间：December 19, 2013
• 年：2013
• 卷：117
• 期：50
• 页码：13908-13918
• 全文大小：454K
• 年卷期：v.117,no.50(December 19, 2013)
• ISSN：1520-5215

文摘

The P(11) line of the 谓₁ + 谓₃ combination band of C₂H₂ was studied using an extended cavity diode laser locked to a frequency comb. Line shapes were measured for acetylene and nitrogen gas mixtures at a series of temperatures between 125 and 296 K and total pressures up to 1 atm. The data were fit to two speed-dependent line shape models and the results were compared. Line shape parameters were determined by simultaneously fitting data for all temperatures and pressures in a single multispectrum analysis. Earlier pure acetylene measurements [Cich et al. Appl. Phys. B 2012, 109, 373鈥?8] were incorporated to account for self-perturbation. The resulting parameters reproduce the observed line shapes for the acetylene-nitrogen system over the range of temperatures and pressures studied with average root-mean-square observed-calculated errors of individual line measurement fits of approximately 0.01% of maximum transmission, close to the experimental signal-to-noise ratios. Errors in the pressure measurements constitute the major systematic errors in these measurements, and a statistical method is developed to quantify their effects on the line shape parameters for the present system.