Characterization of a Surface Reaction by Means of Atomic Force Microscopy

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• 作者：Florian Albrecht ; Niko Pavli膷ek ; Coral Herranz-Lancho ; Mario Ruben ; Jascha Repp
• 刊名：Journal of the American Chemical Society
• 出版年：2015
• 出版时间：June 17, 2015
• 年：2015
• 卷：137
• 期：23
• 页码：7424-7428
• 全文大小：293K
• ISSN：1520-5126

文摘

We study a thermally activated on-surface planarization reaction by a detailed analysis of the reactant and reaction products from atomically resolved atomic force microscopy (AFM) images and spectroscopy. The three-dimensional (3D) structure of the reactant, a helical diphenanthrene derivative, requires going beyond constant-height imaging. The characterization in three dimensions is enabled by acquisition and analysis of the AFM signal in a 3D data set. This way, the structure and geometry of nonplanar molecules as well as their reaction products on terraces and at step edges can be determined.