Optical Constants of Electrodeposited Mixed Molybdenum-Tungsten Oxide Films Determined by Variable-Angle Spectroscopic Ellipsometry
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文摘
Mixed molybdenum-tungsten oxides of varying stoichiometry (MoxW1-xO3, 0 < x < 1) prepared by cathodicelectrodeposition from aqueous peroxo-polymolybdotungstate solutions on indium tin oxide (ITO) coatedglass substrates were evaluated by variable-angle spectroscopic ellipsometry (VASE) and transmissionmeasurements from 200 to 1000 nm (1.24-6.2 eV). A Tauc-Lorentz dispersion model was used to determinethe real and imaginary components of the complex refractive index for MoxW1-xO3 films as a function of Mofraction. The optical band gaps were also estimated from Tauc plots. The refractive index increased (2.07-2.20 at 800 nm) while the optical band gap decreased (3.38-2.95 eV) in a linear fashion for MoxW1-xO3films with increasing Mo fraction. These trends correlate chiefly with Mo-doping-induced changes in filmstructure and grain size as supported by X-ray diffraction measurements.

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