Mapping Impurity of Single-Walled Carbon Nanotubes in Bulk Samples with Multiplex Coherent Anti-Stokes Raman Microscopy
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- 作者：Alex S. Duarte ; Jean Rehbinder ; Ricardo R. B. Correia ; Tiago Buckup ; Marcus Motzkus
- 刊名：Nano Letters
- 出版年：2013
- 出版时间：February 13, 2013
- 年：2013
- 卷：13
- 期：2
- 页码：697-702
- 全文大小：386K
- 年卷期：v.13,no.2(February 13, 2013)
- ISSN：1530-6992
文摘
Mapping of defects in bulk samples of single-walled carbon nanotubes (SWNT) is performed via multiplex coherent anti-Stokes Raman microscopy. The D and G vibrational bands are acquired simultaneously, and their relative amplitude is used as a criterion to quantify the local purity in spin-coated SWNT samples. We observe that defects induced by oxidation are related to the spatial dispersion of nanotubes in a solid distribution.