Measurement of Heavy Ion Irradiation Induced In-Plane Strain in Patterned Face-Centered-Cubic Metal Films: An in Situ Study
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文摘
Nanocrystalline Ag, Cu, and Ni thin films and their coarse grained counterparts are patterned using focused ion beam and then irradiated by Kr ions within an electron microscope at room temperature. Irradiation induced in-plane strain of the films is measured by tracking the location of nanosized holes. The magnitude of the strain in all specimens is linearly dose-dependent and the strain rates of nanocrystalline metals are significantly greater as compared to that of the coarse grained metals. Real-time microscopic observation suggests that substantial grain boundary migration and grain rotation are responsible for the significant in-plane strain.