Atomic Resolution Imaging of Grain Boundary Defects in Monolayer Chemical Vapor Deposition-Grown Hexagonal Boron Nitride

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• 作者：Ashley L. Gibb ; Nasim Alem ; Jian-Hao Chen ; Kristopher J. Erickson ; Jim Ciston ; Abhay Gautam ; Martin Linck ; Alex Zettl
• 刊名：The Journal of the American Chemical Society
• 出版年：2013
• 出版时间：May 8, 2013
• 年：2013
• 卷：135
• 期：18
• 页码：6758-6761
• 全文大小：329K
• 年卷期：v.135,no.18(May 8, 2013)
• ISSN：1520-5126

文摘

Grain boundaries are observed and characterized in chemical vapor deposition-grown sheets of hexagonal boron nitride (h-BN) via ultra-high-resolution transmission electron microscopy at elevated temperature. Five- and seven-fold defects are readily observed along the grain boundary. Dynamics of strained regions and grain boundary defects are resolved. The defect structures and the resulting out-of-plane warping are consistent with recent theoretical model predictions for grain boundaries in h-BN.