Neutron Reflectivity Determination of Buried Electroactive Interface Structure: PBT/PPy and PBT/PXV Bilayers
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- 作者：A. Robert Hillman ; Paul M. Saville ; Andrew Glidle ; Robert M. Richardson ; Stephen J. Roser ; Marcus J. Swann ; and John R. P. Webster
- 刊名：Journal of the American Chemical Society
- 出版年：1998
- 出版时间：December 16, 1998
- 年：1998
- 卷：120
- 期：49
- 页码：12882 - 12890
- 全文大小：253K
- 年卷期：v.120,no.49(December 16, 1998)
- ISSN：1520-5126
文摘
Structure-property correlations of two electroactive polymer bilayers fabricated by different methodsare investigated using neutron reflectivity to probe the buried polymer/polymer interfaces. Both bilayers utilizeelectropolymerized poly(2,2'-bithiophene) as an inner, mediating layer, while the outer layer consists of eitherelectropolymerized polypyrrole or electroprecipitated polyxylylviologen, respectively. These devices have verydifferent current-potential behaviors, which neutron reflectivity shows is a consequence of the fabricationmethod and the resulting polymer/polymer interfacial structure. The polybithiophene/polypyrrole film is foundto be of composite structure while polybithiophene/polyxylylviologen forms a film comprised of segregatedpolymer layers.