Quantitative Structure-Property Relationship in a Combinatorial Bi4-xLaxTi3O12 (0 x 1) Th
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文摘
A ferroelectric Bi4-xLaxTi3O12 (BLT) thin film library was fabricated from Bi2O3/La2O3/TiO2 multilayersusing a multitarget RF-sputtering system equipped with an automated shutter. The polarization-electricfield and structure were mapped as a function of the La content from x = 0 to 1. Remnant polarization (Pr)increased as the La content decreased, and it reached a maximum 2Pr of 20 C/cm2 at x = 0.28. At x <0.28, 2Pr decreased gradually as the La content decreased. This compositional dependence of the remanentpolarization was the result of the degree of TiO6 tilting along the a-b plane changing as a function of theLa content. This was quantitatively related to the intensity ratio between the (117) peak and the (008) peakin the X-ray diffraction (XRD) pattern and to the intensity of the Raman band at 848 cm-1, arising fromstretching mode of TiO6 octahedrons.

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