Unde
rstanding the st
ructu
re-p
rope
rty
relationship fo
r o
rganic semiconducto
rs is c
rucial in
rationalmolecula
r design and o
rganic thin film p
rocess cont
rol. Cha
rge ca
rrie
r t
ranspo
rt in o
rganic field-effectt
ransisto
rs p
redominantly occu
rs in a few semiconducto
r laye
rs close to the inte
rface in contact with thedielect
ric laye
r, and the t
ranspo
rt p
rope
rties depend sensitively on the p
recise molecula
r packing. The
refo
re,a bette
r unde
rstanding of the impact of molecula
r packing and thin film mo
rphology in the fi
rst few monolaye
rsabove the dielect
ric laye
r on cha
rge t
ranspo
rt is needed to imp
rove the t
ransisto
r pe
rfo
rmance. In thisA
rticle, we show that the detailed molecula
r packing in thin o
rganic semiconducto
r films can be solvedth
rough a combination of g
razing incidence X-
ray diff
raction (GIXD), nea
r-edge X-
ray abso
rption spect
rafine st
ructu
re (NEXAFS) spect
roscopy, ene
rgy minimization packing calculations, and st
ructu
re
refinementof the diff
raction data. We solve the thin film st
ructu
re fo
r 2 and 20 nm thick films of tet
raceno[2,3-
b]thiophene and detect only a single phase fo
r these thicknesses. The GIXD yields accu
rate unit celldimensions, while the p
recise molecula
r a
rrangement in the unit cell was found f
rom the ene
rgy minimizationand st
ructu
re
refinement; the NEXAFS yields a consistent molecula
r tilt. Fo
r the 20 nm film, the unit cell ist
riclinic with
a = 5.96 &A
ring;,
b = 7.71 &A
ring;,
c = 15.16 &A
ring;,
![](/images/gifcha<font color=)
rs/alpha.gif" BORDER=0> = 97.30
![](/images/entities/deg.gif)
,
![](/images/gifcha<font color=)
rs/beta2.gif" BORDER=0 ALIGN="middle"> = 95.63
![](/images/entities/deg.gif)
,
![](/images/gifcha<font color=)
rs/gamma.gif" BORDER=0 > = 90
![](/images/entities/deg.gif)
; the
re a
re two moleculespe
r unit cell with he
rringbone packing (49-59
![](/images/entities/deg.gif)
angle) and tilted about 7
![](/images/entities/deg.gif)
f
rom the subst
rate no
rmal. Thethin film st
ructu
re is significantly diffe
rent f
rom the bulk single-c
rystal st
ructu
re, indicating the impo
rtanceof cha
racte
rizing thin film to co
rrelate with thin film device pe
rfo
rmance. The
results a
re compa
red to theco
rresponding data fo
r the chemically simila
r and widely used pentacene. Possible effects of the obse
rvedthin film st
ructu
re and mo
rphology on cha
rge ca
rrie
r mobility a
re discussed.