The e
lectrodeposition of te
llurium (Te) and indium (In) atomic
layers on n-type GaAs(100) substrates isdescribed. As-received n-GaAs(100) substrates were treated in 10% HF and u
ltravio
let (UV) ozone c
leaned.The substrates were then transferred to an u
ltrahigh vacuum (UHV) chamber and c
leaned by Ar
+ ionbombardment. The c
lean substrate was then transferred into an attached e
lectrochemistry ante-chamber andimmersed in a te
lluride so
lution, where a number of deposition potentia
ls were investigated. The resu
ltingAuger peak height ratios, Te/Ga, were p
lotted versus the Te deposition potentia
l. From the Auger ratios, itwas evident that bu
lk Te was formed between -0.4 and -0.8 V, whi
le be
low -0.8 V, a reduction featurewas observed corresponding to the reduction of Te to the te
lluride ion (Te
0 + 2e
- ![](/images/entities/rarr.gif)
Te
2-). Be
low -0.9 V,on
ly a surface-
limited atomic
layer of Te was
left on the GaAs surface. Indium deposition on this Te-coatedGaAs surface was a
lso performed, and e
lectrodeposited ad
layer thicknesses were ca
lcu
lated from the Augerdata. Indium e
lectrodeposited direct
ly on the GaAs surface resu
lted in 3D nuc
leation and growth of wide
lyspaced In c
lusters. E
lectrodeposition of In on an atomic
layer of Te on the GaAs surface resu
lted in
layer-by-
layer growth. A
lternation of atomic
layers of Te and In resu
lted in formation of indium te
lluride nanofi
lms,probab
ly In
2Te
3, by e
lectrochemica
l atomic
layer deposition (ALD). Deposits with up to three cyc
les wereperformed.