Surface Heterogeneity of Polystyrene Latex Particles Determined by Dynamic Force Microscopy

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• 作者：Susheng Tan ; Robert L. Sherman ; Jr. ; Dongqi Qin ; and Warren T. Ford
• 刊名：Langmuir
• 出版年：2005
• 出版时间：January 4, 2005
• 年：2005
• 卷：21
• 期：1
• 页码：43 - 49
• 全文大小：805K
• 年卷期：v.21,no.1(January 4, 2005)
• ISSN：1520-5827

文摘

Atomic force microscopy (AFM) was employed to characterize the surface chemistry distribution onindividual polystyrene latex particles. The particles were obtained by surfactant-free emulsion polymerizationand contained hydrophilic quaternary ammonium chloride, sodium sulfonate, or hydroxyethyl groups. Thephase shift in dynamic force mode AFM is sensitive to charge/chemical interactions between an oscillatingatomic force microscope tip and a sample surface. In this work, the phase imaging technique distinguishedphase domains of 50-100 nm on the surfaces of dried latex particles in ambient air. The domains areattributed to the separation of ion-rich and ion-poor components of the polymer on the particle surface.