Reversible Defect Engineering of Single-Walled Carbon Nanotubes Using Scanning Tunneling Microscopy

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• 作者：Maxime Berthe ; Shoji Yoshida ; Yuta Ebine ; Ken Kanazawa ; Arifumi Okada ; Atsushi Taninaka ; Osamu Takeuchi ; Nobuyuki Fukui ; Hisanori Shinohara ; Satoru Suzuki ; Koji Sumitomo ; Yoshihiro Kobayashi ; Bruno Gr
• 刊名：Nano Letters
• 出版年：2007
• 出版时间：December 2007
• 年：2007
• 卷：7
• 期：12
• 页码：3623 - 3627
• 全文大小：329K
• 年卷期：v.7,no.12(December 2007)
• ISSN：1530-6992

文摘

The experimental creation and annihilation of defects on single-walled carbon nanotubes (SWCNT) with the tip of a scanning tunneling microscopeare reported. The technique used to manipulate the wall structure of a nanotube at the atomic scale consists of a voltage ramp applied atconstant tunneling current between the tip and the nanotube adsorbed on a gold substrate. While topographic images show an interferencepattern at the defect position, spatially resolved tunneling spectroscopy reveals the presence of localized states in the band gap of thenanotube. Removal of the defect by the same procedure demonstrates the reversibility of the process. Such a precise control in the localmodification of the nanotube wall opens up new opportunities to tailor SWCNT electronic properties at will.