Systematic Multidimensional Quantification of Nanoscale Systems From Bimodal Atomic Force Microscopy Data

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• 作者：Chia-Yun Lai ; Sergio Santos ; Matteo Chiesa
• 刊名：ACS Nano
• 出版年：2016
• 出版时间：June 28, 2016
• 年：2016
• 卷：10
• 期：6
• 页码：6265-6272
• 全文大小：705K
• 年卷期：0
• ISSN：1936-086X

文摘

Here we explore the raw parameter space in air in bimodal atomic force microscopy (AFM) in order to enhance resolution, provide multiparameter maps, and produce suitable transformations that lead to physically intuitive maps general enough to be recognized by the broader community, i.e., stiffness, Hamaker constant, and adhesion force. We further consider model free transforms to enhance the raw parameter space in the form of alternative and more intelligible contrast maps. We employ highly oriented pyrolytic graphite, calcite, polypropylene, and dsDNA on mica to demonstrate a systematic form of parameter expansion. The proposed methodology to enhance and interpret a larger parameter space introduces a methodology to tractable multidimensional AFM from raw bimodal AFM maps.