New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures
详细信息    查看全文
文摘
In this combined atomic force microscopy and X-ray diffraction study, we explore the microscopic origin of the scaling properties of the growth of organic−organic heterostructures formed here by F16CoPc and diindenoperylene (DIP) molecules as representative systems for electron and hole transporting materials. We evaluate the influence of the morphological properties of the first organic layer (DIP) on further temporal evolution of the morphology and structure of F16CoPc films. From the derived scaling exponents, we conclude that the morphology evolution is dominated by mound formation. The microscopic origin of such morphology is ascribed to structural changes occurring during the first stages of F16CoPc growth as revealed by grazing incidence X-ray diffraction (GIXD). The microstructure of organic materials should be taken into account, the challenging task of modeling growing surfaces and interfaces of organic materials.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700