Electron Emission from Hypervelocity C60 Impacts

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• 作者：M. J. Eller ; S. V. Verkhoturov ; S. Della-Negra ; E. A. Schweikert
• 刊名：Journal of Physical Chemistry C
• 出版年：2010
• 出版时间：October 14, 2010
• 年：2010
• 卷：114
• 期：40
• 页码：17191-17196
• 全文大小：302K
• 年卷期：v.114,no.40(October 14, 2010)
• ISSN：1932-7455

文摘

Secondary ion mass spectrometry (SIMS) performed in the event-by-event bombardment detection mode when coupled to an electron emission microscope allows one to investigate individual nano-objects. Two groups of Au and Al oxide nano-objects were compared with their bulk counterparts based on their secondary ion and electron emission from individual C<sub>60sub> impacts at 15 and 30 keV total impact energy. Our results show that electron yields depend on the size and surroundings of the nano-object, and at higher impact energies, these differences in electron emission are more pronounced. A second key observation for systems of similar chemical makeup but different surface topography and size is that the emission of secondary ions and electrons is independent of each other.