Three-Dimensional Trace Element Analysis by Confocal X-ray Microfluorescence Imaging
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文摘
A three-dimensional (3D) variant of scanning micro X-rayfluorescence (XRF) is described and evaluated at theID18F instrument of the European Synchrotron RadiationFacility (ESRF). The method is based on confocal excitation/detection using a polycapillary half-lens in front ofthe energy-dispersive detector. The experimental arrangement represents a significant generalization of regular two-dimensional (2D) scanning micro-XRF and employs adetector half-lens whose focus coincides with that of thefocused incoming beam. The detection volume defined bythe intersection of the exciting beam and the energy-dependent acceptance of the polycapillary optics is 100-350 m3. Minimum detection limits are sub-ppm, andsensitivities are comparable with regular scanning XRF.Next to the reduction of in-sample single/multiple scattering, the setup provides the possibility of sample depthscans with an energy-dependent resolution of 10-35 min the energy range of 3-23 keV and the possibility ofperforming 3D-XRF analysis by simple XYZ linear scanning. This provides a suitable alternative to X-ray fluorescence tomography. The method is illustrated with resultsof the analysis of solid inclusions in diamond and fluidinclusions in quartz.

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