Quantitative Correlation between Defect Density and Heterogeneous Electron Transfer Rate of Single Layer Graphene
详细信息 查看全文
- 作者：Jin-Hui Zhong ; Jie Zhang ; Xi Jin ; Jun-Yang Liu ; Qiongyu Li ; Mao-Hua Li ; Weiwei Cai ; De-Yin Wu ; Dongping Zhan ; Bin Ren
- 刊名：Journal of the American Chemical Society
- 出版年：2014
- 出版时间：November 26, 2014
- 年：2014
- 卷：136
- 期：47
- 页码：16609-16617
- 全文大小：556K
- ISSN：1520-5126
文摘
Improving electrochemical activity of graphene is crucial for its various applications, which requires delicate control over its geometric and electronic structures. We demonstrate that precise control of the density of vacancy defects, introduced by Ar+ irradiation, can improve and finely tune the heterogeneous electron transfer (HET) rate of graphene. For reliable comparisons, we made patterns with different defect densities on a same single layer graphene sheet, which allows us to correlate defect density (via Raman spectroscopy) with HET rate (via scanning electrochemical microscopy) of graphene quantitatively, under exactly the same experimental conditions. By balancing the defect induced increase of density of states (DOS) and decrease of conductivity, the optimal HET rate is attained at a moderate defect density, which is in a critical state; that is, the whole graphene sheet becomes electronically activated and, meanwhile, maintains structural integrity. The improved electrochemical activity can be understood by a high DOS near the Fermi level of defective graphene, as revealed by ab initio simulation, which enlarges the overlap between the electronic states of graphene and the redox couple. The results are valuable to promote the performance of graphene-based electrochemical devices. Furthermore, our findings may serve as a guide to tailor the structure and properties of graphene and other ultrathin two-dimensional materials through defect density engineering.